Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

Journal of Applied Crystallography

Meduňa, M.; Isa, F.; Jung, A.; Marzegalli, A.; Albani, M.; Isella, G.; Zweiacker, K.; Miglio, L.; von Känel, H., 2018: Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. JOURNAL OF APPLIED CRYSTALLOGRAPHY 51(2), p. 368 - 385, doi: 10.1107/S1600576718001450

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