Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe

VACUUM

ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J., 2018: Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. VACUUM 152, p. 138 - 7, doi: 10.1016/j.vacuum.2018.03.014; FULL TEXT
(UHV-LEIS, KRATOS-XPS)

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