- X-ray diffractometer X’Pert Pro MPD (PANalytical)
- Scanning probe microscope LiteScope for correlative SEM/SPM imaging (NenoVision)
- Scanning electron microscope Lyra 3 FEG/SEM/xFIB (TESCAN)
- High-resolution transmission electron microscope JEM-2100F (JEOL) with X-Max80 EDS detector for X-ray microanalysis (Oxford Instruments)
- Mössbauer spectrometer CCS-800 (Janis Research)
- Vibrating sample magnetometer VSM 7400 (Lake Shore)
- Physical Property Measurement System (PPMS) EC II for magnetic fields to 9 T (Quantum Design)
- Equipment for measurements of hysteresis loops Remacomp C-710 (Remagraph)
- High-temperature tubular ovens for thermal processing of materials in inert gas, hydrogen or in vacuum
- Equipment for spark plasma synthesis of nanopowders
