X-ray induced electrostatic graphene doping via defect charging in gate dielectric

SCIENTIFIC REPORTS

Prochazka, P; Marecek, D; Liskova, Z; Cechal, J; Sikola, T, 2017: X-ray induced electrostatic graphene doping via defect charging in gate dielectric. SCIENTIFIC REPORTS 7, doi: 10.1038/s41598-017-00673-z (MIRA, DIENER, ALD, WIRE-BONDER)

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