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Characterization of oxidized gallium droplets on silicon surface: An ellipsoidal droplet shape model for angle resolved X-ray photoelectron spectroscopy analysis

THIN SOLID FILMS

Cechal, J; Matlocha, T; Polcak, J; Kolibal, M; Tomanec, O; Kalousek, R; Dub, P; Sikola, T, 2009: Characterization of oxidized gallium droplets on silicon surface: An ellipsoidal droplet shape model for angle resolved X-ray photoelectron spectroscopy analysis. THIN SOLID FILMS 517(6), p. 1928 - 1934

Research Groups:

• Fabrication and Characterisation of Nanostructures

CEITEC authors:

• Miroslav Kolíbal, Ph.D.
• Prof. Tomáš Šikola
• Prof. Petr Dub
• Radek Kalousek, Ph.D.