Conference

EuroNanoLab Dry Etch Process Meeting June 6-7 2019

About event

3rd Meeting on Dry Etching Process organized by CEITEC Nano Research Infrastructure.

EUROnanoLAB - Setting up a European infrastructure that incorporates most of the academic clean rooms in which tomorrow’s nanosystems will be designed is the goal of the EuroNanoLab project. CEITEC Nano is a founding partner of EuroNanoLab consortium.

Preliminary Program:

Thursday, June 6, 2019

9:00   Welcome at CEITEC BUT - Conference room at Building "S" 1st floor
9:30–12:30   Morning Lectures
   

Etching of III-V materials
Stephane Guilet (C2N): "Plasma etching : Is it really possible to use the same recipe in different machines ? What are the limits ?"
Chevolleau Thierry (LTM CNRS-UGA): “Development of etching processes of III-V materials from the nanometer scale to the micrometer scale”
Martijn de Roosz (NTNU NanoLab):  “BCl3 issues: Are there any alternatives for this process gas?“

    Coffe Break
   

Etching of Silicon:
Aurelie  Lecestre (LAAS): “One Si etching process used in 3 differents equipments (RIE; RIE-ICP; DRIE-ICP)“
Djaffar Belharet (Femto-ST):  Presentation about Bosch process possibilities on SPTS machines, from classic bosch (2 steps), bosch process using 3 steps and the bosch process using 4 steps (C4F8, O2, Ar, SF6)

Black Silicon
Kaiying Wang (USN): “Metal-mask assisted Bosch etching for nanostructured black silicon”

12:30–13:30   Lunch
13:30–17:00   Afternoon Lectures
   

Documentation
Christiaan Bruinink (MESA+ NanoLab): status, update forum and equipment database

CEITEC Nano Users experiences
Jiri Liska: "Preparation of SiN nanopores using RIE technique."
Peter Fecko: "Smooth wall profile with Bosch process silicon etching." 

Silicon Etching; notching
Dmitri Yarekha (Univ-Lille): Presentation about the notching issue on our Estrelas system

    Coffee Break
    New expert members:
Christoph Seiffert: "MiNaLab at the University of Oslo"
Lorenza Ferrario and Sabina Ronchin (FBK – MTlab Trentino): An overview of RIE and DRIE technology at FBK cleanroom: chemistry, material processed, main results
17:00–18:00   Clean Room Labs Excursion
18:00   Transfer to Brno's Dam
19:00–21:30   Evening program


Friday, June 7, 2019

9:00–12:00   Morning Lectures
   

Endpoint detection
Nils Nordell (KTH): the Ionfab 300Plus from Oxford is equipped with two EPD. A spectrometer from Verity (SD1024) and a retractable SIMS from Hiden.

Christoph Seifert (MiNaLab Oslo): Presentation about endpoint detection techniques
    Coffee Break
    Djaffar Belharet (FEMTO-ST): end point detection methods, results obtained by the Claritas system which is integrated on Rapier machines (based on OES technique)
   

Next Meeting on Dry Etching

12:00–13:00   Lunch
13:00   End of Meeting

 

Date

6. - 7. 6. 2019, 09:00 - 13:00
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Venue

CEITEC BUT, Brno, Purkyňova 123, Building S, Conference Room