Ultra High Vacuum Preparation and Analytical System - Low Energy Electron Microscope SPECS FE-LEEM P90 (UHV-LEEM)

CONTACT US

Guarantor: Josef Polčák, Ph.D.
Instrument status: Operational Operational, 24.11.2023 10:03
Equipment placement: CEITEC Nano - C1.38
Research group: CF: CEITEC Nano


Description:

Low energy electron microscope (LEEM) is one of the instruments of the UHV-Cluster, which combines preparation and in-situ analysis by several complementary methods for the characterization of surfaces and thin films. The LEEM instrument utilizes low energy, elastically backscattered electrons to image surfaces with high spatial and temporal resolution. Advantages of LEEM over other surface imaging techniques are real-time imaging capability and existing several unique contrast mechanisms for image formation. LEEM is a powerful tool for studying the dynamic and static properties of surfaces and thin films, phase transitions, reactions, structure and morphology, and more.


Publications:

  • Jakub, Z.; Shahsavar, A.; Planer, J.; Hrůza, D.; Herich, O.; Procházka, P.; Čechal, J., 2024: How the Support Defines Properties of 2D Metal–Organic Frameworks: Fe-TCNQ on Graphene versus Au(111). JOURNAL OF THE AMERICAN CHEMICAL SOCIETY 146(5), p. 3471 - 3482, doi: 10.1021/jacs.3c13212; FULL TEXT
    (UHV-DEPOSITION, UHV-LEEM, UHV-XPS, UHV-PREPARATION, UHV-SPM)
  • Makoveev, A. O., 2023: Molecular self-assembly on surfaces: the role of coverage, surface orientation and kinetics. PH.D. THESIS , p. 1 - 169; FULL TEXT
    (UHV-DEPOSITION, UHV-LEEM, UHV-XPS, UHV-PREPARATION, UHV-SPM)
  • PROCHÁZKA, P.; ČECHAL, J., 2023: Visualization of molecular stacking using low-energy electron microscopy. ULTRAMICROSCOPY 253, doi: 10.1016/j.ultramic.2023.113799; FULL TEXT
    (UHV-DEPOSITION, UHV-LEEM, UHV-PREPARATION, UHV-SPM)
  • David, J., 2023: Preparation of elementary 2D materials and heterostructures. MASTER´S THESIS , p. 1 - 69; FULL TEXT
    (UHV-DEPOSITION, UHV-PREPARATION, UHV-LEEM, UHV-XPS, UHV-SPM)
  • Jeřábek, F., 2023: Microscopic and spectroscopic analysis of elementary 2D materials. BACHELOR´S THESIS , p. 1 - 42; FULL TEXT
    (UHV-DEPOSITION, UHV-PREPARATION, UHV-LEEM, UHV-SPM)

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